Microscopy Electron microscopy

I've never used electron microscopy in my research, but I just had a lecture about it) One of the newest method is electronic microscope of liquid samples.  It opens up many new opportunities 

Hi! The most widely used are transmission and scanning electron microscopy. Transmission electron microscopy is used to study ultrathin sections of microbes, tissues, as well as the structure of small objects (viruses, flagella, etc.), contrasted with phosphoric-tungstic acid, uranyl acetate, metal deposition in a vacuum, etc.
Scanning electron microscopy is used to study the surface of objects.

@elizaveta-msu Nobody has mentioned atomic force microscopy yet 😊 

@argentum as far as I know atomic force microscope refers to a high-resolution scanning probe microscope and is used to determine the surface relief 

@argentum but actually I've never used this method so I could be wrong

@elizaveta-msu I remember in the magistracy we taught separately scanning and atomic force microscopy

@elizaveta-msu, I would like to know how to achieve a higher resolution in TEM (transmission electron microscopy)?

@nanochimik47 what is then the principle of the atomic force microscope?

@nanochimik47 I believed that scanning microscopy is a class of microscopy, the main types of which are, for example, scanning atomic force microscopy, scanning tunnel microscopy, Near-Field optical microscopy etc.

@elizaveta-msu The principle of operation of an atomic force microscope is based on the registration of the force interaction between the surface of the sample under study and the probe. A nanoscale tip located at the end of an elastic cantilever called a cantilever is used as a probe. The force acting on the probe from the surface causes the arm to bend. The appearance of hills or depressions under the tip leads to a change in the force acting on the probe, and hence to a change in the magnitude of the cantilever bending. Thus, by registering the amount of bending, it is possible to draw a conclusion about the surface relief.

@nanochimik47 Yes, that's correct. At the same time, in all articles and textbooks I saw exactly "scanning atomic force microscopy", and the definition "Atomic force microscopy is one of the types of scanning probe microscopy based on van der Waals interactions of the probe with the sample surface". It seems to me that we are talking about the same thing but can't come to a consensus in any way.

@nknh716 but I wrote that I didn't work directly with microscopy, so I find it difficult to answer this question, sorry